BS EN 12544-2-2000 无损检验.X射线管电压的测量和评估.用厚滤膜法进行连续检验

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【英文标准名称】:Non-destructivetesting-MeasurementandevaluationoftheX-raytubevoltage-Constancycheckbythethickfiltermethod
【原文标准名称】:无损检验.X射线管电压的测量和评估.用厚滤膜法进行连续检验
【标准号】:BSEN12544-2-2000
【标准状态】:现行
【国别】:英国
【发布日期】:2000-06-15
【实施或试行日期】:2000-06-15
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:试验;测量;X射线电子管;无损检验;阀门电压;X射线;直流电压;电压;无损伤的;射线摄影;辐射防护;电压测量;X射线设备;方法;稳定性试验;稳定性;图象质量;对比度;高电压;材料试验;解释
【英文主题词】:
【摘要】:ThisstandardspecifiesaconstancycheckofaX-raysystemwheremainlytheX-rayvoltageischeckedandalsothetubecurrentandtheconstitutionofthetargetwhichcanbechangingduetoageingofthetube.ThethickfiltermethodisbasedonameasurementofthedoseratebehindadefinedthickfilterusingdefineddistancesbetweentheX-raytube,thefilterandthemeasuringdevice.Thismethodisverysensitivetochangesofthevoltage,butitdoesnotprovideanabsolutevalueforX-raytubevoltage.Therefore,areferencevalueisneededand,itisrecommendedtofindthisreference,forexample,withintheacceptancetestofthesystem.ThethickfiltermethodisarathersimpletechniqueandmaybeappliedbytheoperatorofanX-raysystemtoperformregularlyaconstancycheckofthesystem.ThemethodcanalsobeappliedforconsistencychecksafterchangingcomponentswhichmayaffecttheX-raytubevoltage.ThismethodcanbeappliedforalltypesofX-raysystems,i.e.forconstantpotential,halfwaveandimpulsewavegeneratorswithatubecurrentlargerthan1mA.
【中国标准分类号】:H26
【国际标准分类号】:19_100
【页数】:12P;A4
【正文语种】:英语